Atomic force and scanning tunneling microscopy analysis of palladium and silver nanophase materials

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Sattler, K.
Raina, G.
Ge, M.
Venkateswaran, N.
Xhie, J.
Liao, Y.X.
Siegel, R.W.
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| 1600年 / American Inst of Physics, Woodbury, NY, USA卷 / 76期
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