Avoiding combinatorial explosion in automatic test generation: Reasoning about measurements is the key

被引:0
|
作者
Lange, Harald
Moller, Ralf
Neumann, Bernd
机构
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 8 条
  • [1] COMBINATORIAL DESIGN APPROACHES FOR AUTOMATIC TEST GENERATION
    Shi Liang Xu Baowen Nie Changhai Dept of Computer Science Eng Southeast University Nanjing ChinaJiangsu Institute of Software Quality Nanjing China Dept of Computer National University of Defense Technology Changsha China
    [J]. Journal of Electronics, 2005, (02) : 205 - 208
  • [2] Combinatorial design approach to automatic test generation
    Bellcore, Morristown, United States
    [J]. IEEE Software, 5 (83-88):
  • [3] The combinatorial design approach to automatic test generation
    Cohen, DM
    Dalal, SR
    Parelius, J
    Patton, GC
    [J]. IEEE SOFTWARE, 1996, 13 (05) : 83 - 88
  • [4] COMBINATORIAL DESIGN APPROACHES FOR AUTOMATIC TEST GENERATION
    Shi Liang Xu Baowen Nie Changhai (Dept of Computer Science & Eng.
    [J]. Journal of Electronics(China), 2005, (02) : 205 - 208
  • [5] Automatic test generation for n-way combinatorial testing
    Nie, CH
    Xu, BW
    Shi, L
    Dong, GW
    [J]. QUALITY OF SOFTWARE ARCHITECTURES AND SOFTWARE QUALITY, PROCEEDINGS, 2005, 3712 : 203 - 211
  • [6] Automatic test case generation for WS-Agreements using combinatorial testing
    Palacios, Marcos
    Garcia-Fanjul, Jose
    Tuya, Javier
    Spanoudakis, George
    [J]. COMPUTER STANDARDS & INTERFACES, 2015, 38 : 84 - 100
  • [7] EDA LEADERS GETTING SERIOUS ABOUT AUTOMATIC TEST-GENERATION
    TUCK, B
    [J]. COMPUTER DESIGN, 1992, 31 (09): : 33 - 35
  • [8] Automatic Test Suite Generation for Key-Points Detection DNNs using Many-Objective Search (Experience Paper)
    Ul Haq, Fitash
    Shin, Donghwan
    Briand, Lionel C.
    Stifter, Thomas
    Wang, Jun
    [J]. ISSTA '21: PROCEEDINGS OF THE 30TH ACM SIGSOFT INTERNATIONAL SYMPOSIUM ON SOFTWARE TESTING AND ANALYSIS, 2021, : 91 - 102