COMBINATORIAL DESIGN APPROACHES FOR AUTOMATIC TEST GENERATION

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作者：
Shi Liang Xu Baowen Nie Changhai Dept of Computer Science Eng Southeast University Nanjing ChinaJiangsu Institute of Software Quality Nanjing China Dept of Computer National University of Defense Technology Changsha China [210096 ,210096 ,410073 ]
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JournalofElectronics | 2005年 / 02期
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摘要：
<正>The n-way combination testing is a specification-based testing criterion, which requires that for a system consisted of a few parameters, every combination of valid values of arbitrary n(n ≥ 2) parameters be covered by at least one test. This letter proposed two different test generation algorithms based on combinatorial design for the n-way coverage criterion. The automatic test generators are implemented and some valuable empirical results are obtained.
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页码：205 / 208
页数：4
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