Optical monitoring of contamination on high-voltage device

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[1] Sun, Yan
[2] Zhao, Wen-Bin
[3] Zhang, Guan-Jun
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Sun, Y. (sunyan@mailst.xjtu.edu.cn) | / Institute of Electrical Engineers in Japan, IEEJ, TCDEI; IEEE Dielectrics and Electrical Insulation Society; Kyushu Institute of Technology; Waseda University; City of Kitakyushu; Kitakyushu Convention Bureau卷 / Institute of Electrical Engineers of Japan期
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