Wettability of polished silicon oxide surfaces

被引：0

作者：

Thomas, Richard R. ^{[1
]}

Kaufman, Frank B. ^{[1
]}

Kirleis, Juergen T. ^{[1
]}

Belsky, Richard A. ^{[1
]}

机构：

[1] E.I. DuPont de Nemours and Co, Deepwater, United States

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