Determination of trace silicon in zirconium matrices and steels by inductively coupled plasma – atomic emission spectrometry

被引：0

作者：

Choi, Kwang-Soon ^{[1
]}

Joe, Kih-Soo ^{[1
]}

Mitchell, Steven L. ^{[2
]}

Everall, Candace J. ^{[2
]}

Betty, Keith R. ^{[2
]}

机构：

[1] Nuclear Chemistry Laboratory, Korea Atomic Energy Research Institute, P.O. Box 105, Yusong, Taejon,305-600, Korea, Republic of

[2] AECL, Chalk River Laboratories, Chalk River,ON,KOJ 1J0, Canada

来源：

Canadian Journal of Chemistry | 1999年 / 77卷 / 08期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：1405 / 1409

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