X-ray absorption spectroscopy on light emitting porous silicon by XEOL and TEY

被引：0
|
作者：
Dalba, G.
Daldosso, N.
Fornasini, P.
Graziola, R.
Grisenti, R.
Rocca, F.
机构：
来源：
Journal of Non-Crystalline Solids | 1998年 / 232-234卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：370 / 376
相关论文
共 50 条
  • [41] X-ray photoelectron spectroscopy depth profile of chemically modified porous silicon
    Nijdam, AJ
    Cheng, MMC
    Ferrari, M
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2006, 24 (02): : 852 - 854
  • [42] Local structure of porous silicon studied by means of X-ray emission spectroscopy
    E.Z. Kurmaev
    V.R. Galakhov
    S.N. Shamin
    V.I. Sokolov
    R.E. Hummel
    M.H. Ludwig
    Applied Physics A, 1997, 65 : 183 - 189
  • [43] Plasmon energy shift in porous silicon measured by x-ray photoelectron spectroscopy
    Mannella, N
    Gabetta, G
    Parmigiani, F
    APPLIED PHYSICS LETTERS, 2001, 79 (26) : 4432 - 4434
  • [44] Local structure of porous silicon studied by means of X-ray emission spectroscopy
    Kurmaev, EZ
    Galakhov, VR
    Shamin, SN
    Sokolov, VI
    Hummel, RE
    Ludwig, MH
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1997, 65 (02): : 183 - 189
  • [45] X-ray Absorption Spectroscopy Analysis of Heavy Metals by Means of a Silicon Detector
    S. M. Osadchii
    A. A. Petukhov
    V. B. Dunin
    Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2019, 13 : 683 - 689
  • [46] X-ray Absorption Spectroscopy Analysis of Heavy Metals by Means of a Silicon Detector
    Osadchii, S. M.
    Petukhov, A. A.
    Dunin, V. B.
    JOURNAL OF SURFACE INVESTIGATION, 2019, 13 (04): : 683 - 689
  • [47] X-ray absorption spectroscopy study on nanowires and nanotubes T carbon and silicon
    Lin, LW
    Tang, YB
    Zhang, W
    SPECTROSCOPY AND SPECTRAL ANALYSIS, 2006, 26 (03) : 571 - 576
  • [48] Study of bulk and interface defects in silicon oxide with X-ray absorption spectroscopy
    Tallarida, Massimo
    Schmeisser, Dieter
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 2007, 144 (1-3): : 23 - 26
  • [49] Electronic structures of silicon monoxide film probed by X-ray absorption spectroscopy
    Baba, Yuji
    Sekiguchi, Tetsuhiro
    Shimoyama, Iwao
    Hirao, Norie
    SURFACE SCIENCE, 2013, 612 : 77 - 81
  • [50] Light assisted formation of porous silicon investigated by X-ray diffraction and reflectivity
    Chamard, V
    Setzu, S
    Romestain, R
    APPLIED SURFACE SCIENCE, 2002, 191 (1-4) : 319 - 327
12345