Microcharacterization and novel device applications of semiconductor-metal eutectic composites

被引：0
|
作者：
Ditchek, B.M. [1 ]
Yacobi, B.G. [1 ]
机构：
[1] GTE Lab, United States
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1988年 / 27卷 / 11期
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摘要：
6
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页码：2155 / 2157
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