MODEL FOR THE MEASUREMENT OF MINORITY CARRIER DIFFUSION LENGTHS USING A SCANNING ELECTRON MICROSCOPE IN THE ELECTRON BEAM INDUCED CURRENT MODE.

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作者：
Soukup, R.J.
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来源：
Applied physics communications | 1982年 / 2卷 / 03期
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摘要：
SEMICONDUCTOR MATERIALS
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页码：143 / 156
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