Microstructural studies of high-Tc superconducting Josephson junctions to understand junction properties

被引：0
|
作者：
Wen, J.G. [1 ]
Usagawa, T. [1 ]
Takagi, T. [1 ]
Ishimaru, Y. [1 ]
Enomoto, Y. [1 ]
Koshizuka, N. [1 ]
机构：
[1] ISTEC, Tokyo, Japan
来源：
IEEE Transactions on Applied Superconductivity | 1999年 / 9卷 / 2 II期
关键词：
Crystal microstructure - Electric properties - Electrodes - Grain boundaries - Liquid phase epitaxy - Single crystals - Substrates - Superconducting films - Transmission electron microscopy - Yttrium barium copper oxides;
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摘要：
Transmission electron microscopy (TEM) is applied to the study of the relationship between the microstructures and the electrical properties of Josephson junctions. Typical microstructures for several artificial barrier junctions and grain boundary (GB) junctions are reviewed. In the case of artificial barrier junctions, it was found that the barrier layer coverage can be enhanced by using a-axis oriented bottom electrodes and homoepitaxy growth. TEM observations of multilayer junctions with PrBa2Cu3Oy (PrBCO) or YBa2Fe3Oy (YBFeO) barrier layers grown by quasi-homoepitaxy showed perfect coverage and good crystallinity. Liquid phase-epitaxy was successfully used to obtain large single facet GBs over 50 μm by growing YBa2Cu3Oy (YBCO) films on bicrystal substrates. Microstructures and atomic arrangements of these straight bicrystal GBs are presented.
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页码：2046 / 2049
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