In-Circuit Testing Also Means Debugging and Diagnosing.

被引：0

|

作者：

Reuber, Wolfgang

机构：

来源：

Elektronik Munchen | 1983年 / 32卷 / 10期

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

2

引用

收藏

页码：63 / 67

相关论文

共 50 条

[41] REDUCING IN-CIRCUIT TESTING COSTS WITH SELF-CORRECTING PROGRAM GENERATIONS
BORRELLI, RN
IEEE TRANSACTIONS ON MANUFACTURING TECHNOLOGY, 1977, 6 (03): : 61 - 63
[42] Magnetic In-circuit Testing of Multiple Power and Ground Pins for Open Faults
Uğur Çilingiroğlu
Journal of Electronic Testing, 2007, 23 : 25 - 34
[43] Magnetic in-circuit testing of multiple power and ground pins for open faults
Cilingiroglu, Ugur
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2007, 23 (01): : 25 - 34
[44] FUNCTIONAL AND IN-CIRCUIT TESTING TEAM UP TO TACKLE VLSI IN THE 80S
HANSEN, P
ELECTRONICS, 1981, 54 (08): : 189 - 195
[45] FUNCTIONAL AND IN-CIRCUIT TESTING TEAM UP TO TACKLE VLSI IN THE '80s.
Hansen, Peter
Electronics, 1981, 54 (08): : 189 - 195
[46] Power Supplies Authoritative Testing. In-circuit and Functional Test in a System.
Heckmueller, Wilfred
Elektronik Munchen, 1986, 35 (15): : 105 - 107
[47] AUTOMATIC QUALITY TESTING OF ASSEMBLED PRINTED-CIRCUITS USING AN IN-CIRCUIT TEST UNIT
GRAFF, A
F&M-FEINWERKTECHNIK & MESSTECHNIK, 1985, 93 (07): : 389 - 391
[48] Non-destructive in-circuit testing device for dielectric substrates without dimensional measurement
Cheng, Jin
Gao, Chong
Cui, Hongling
Li, En
Zhang, Yunpeng
Li, Canping
2022 INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY (ICMMT), 2022,
[49] Problem with no-clean flux spattering on in-circuit testing pads diagnosed by EDS analysis
Dusek, K.
Busek, D.
MICROELECTRONICS RELIABILITY, 2016, 56 : 162 - 169
[50] TEST PATTERN GENERATION METHODOLOGY FOR LSI/VLSI MODULE LEVEL TESTING AND IN-CIRCUIT CARD LEVEL TESTING.
Dinwiddie, J.M.
Viele, A.A.
IBM technical disclosure bulletin, 1984, 26 (11): : 5909 - 5910

← 1 2 3 4 5 →