Rietveld analysis for energy dispersive x-ray diffraction under high pressure with synchrotron radiation

被引：0
|
作者：
Neuling, H.W. [1 ]
Holzapfel, W.B. [1 ]
机构：
[1] Universitaet-GH-Paderborn, Paderborn, Germany
来源：
High Pressure Research | 1992年 / 8卷 / 5-6期
关键词：
Computer aided spectra conversion - Diamond anvil pressure cells - Energy-dispersive X ray diffraction - High pressure crystallography - Rietveld analysis - Software package CORAN - Synchrotron radiation sources - X ray diffraction spectra conversion;
D O I：
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中图分类号：
学科分类号：
摘要：
A new program has been developed for the conversion of energy-dispersive X ray diffraction spectra obtained from powder samples at high pressure in a diamond anvil cell (DAC) into conventional pseudo angle-dispersive data. The program is compatible with a conventional Rietveld program. This allows the determination of the structural parameters of the samples investigated. Results of a synchrotron radiation study of polycrystalline SrFCl in the tetragonal phase at high pressure are presented.
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页码：655 / 660
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