SELECTIVE I/O SCAN: A DIAGNOSABLE DESIGN TECHNIQUE FOR VLSI SYSTEMS.

被引：0
|
作者：
Chau, K.K. [1 ]
Kime, C.R. [1 ]
机构：
[1] Univ of Wisconsin-Madison, Madison,, WI, USA, Univ of Wisconsin-Madison, Madison, WI, USA
来源：
Computers & mathematics with applications | 1987年 / 13卷 / 5-6期
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摘要：
INTEGRATED CIRCUITS, VLSI
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页码：485 / 502
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