SELECTIVE I/O SCAN: A DIAGNOSABLE DESIGN TECHNIQUE FOR VLSI SYSTEMS.

被引：0

作者：

Chau, K.K. ^{[1
]}

Kime, C.R. ^{[1
]}

机构：

[1] Univ of Wisconsin-Madison, Madison,, WI, USA, Univ of Wisconsin-Madison, Madison, WI, USA

来源：

Computers & mathematics with applications | 1987年 / 13卷 / 5-6期

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摘要：

INTEGRATED CIRCUITS, VLSI

引用

页码：485 / 502

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