CHARACTERISATION OF SINGLE-MODE CHANNEL WAVEGUIDES FROM FAR FIELD MEASUREMENTS.
被引:0
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作者:
Kumar, Arun
论文数: 0引用数: 0
h-index: 0
机构:
Indian Inst of Technology, New Delhi, India, Indian Inst of Technology, New Delhi, IndiaIndian Inst of Technology, New Delhi, India, Indian Inst of Technology, New Delhi, India
Kumar, Arun
[1
]
Sinha, R.K.
论文数: 0引用数: 0
h-index: 0
机构:
Indian Inst of Technology, New Delhi, India, Indian Inst of Technology, New Delhi, IndiaIndian Inst of Technology, New Delhi, India, Indian Inst of Technology, New Delhi, India
Sinha, R.K.
[1
]
机构:
[1] Indian Inst of Technology, New Delhi, India, Indian Inst of Technology, New Delhi, India
来源:
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1600年
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63期
关键词:
COVER REFRACTIVE INDEX - FAR FIELD MEASUREMENTS - SINGLE-MODE CHANNEL WAVEGUIDES - SUBSTRATE REFRACTIVE INDEX;
机构:
Optoelectronics Division, Natl. Inst. of Std. and Technology, 325 Broadway, Boulder, CO 80303, United StatesOptoelectronics Division, Natl. Inst. of Std. and Technology, 325 Broadway, Boulder, CO 80303, United States