In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire

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作者：
Fujii, T. [1 ]
Alders, D. [1 ]
Voogt, F.C. [1 ]
Hibma, T. [1 ]
Thole, B.T. [1 ]
Sawatzky, G.A. [1 ]
机构：
[1] Univ of Groningen, Groningen, Netherlands
来源：
| 1996年 / Elsevier Science B.V., Amsterdam, Netherlands卷 / 366期
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