Absorption loss at nanorough silver back reflector of thin-film silicon solar cells

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作者：
机构：
[1] Springer, J.
[2] Poruba, A.
[3] Müllerova, L.
[4] Vanecek, M.
[5] Kluth, O.
[6] Rech, B.
来源：
Springer, J. (springer@fzu.cz) | 1600年 / American Institute of Physics Inc.卷 / 95期
关键词：
Atomic force microscopy - Chlorine compounds - Light absorption - Morphology - Plasmas - Silicon solar cells - Silver - Spectrometers - Surface plasmon resonance - Surface roughness;
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摘要：
The spectra of the total absorption loss of nanorough silver surfaces measured with high accuracy is presented. Instead of the measurement of the total reflectance R and calculation of A=(1-R), the A is measured directly using photothermal deflection spectroscopy (PDS). This helps to increase the precision of measurement for the most important case of weak absorption losses.
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