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- [3] In-situ investigation of surface processes on AlGaAs/GaAs cleavage edges as studied by atomic force microscopy Fresenius' journal of analytical chemistry, 1995, 353 (5-8): : 670 - 674
- [4] IN-SITU INVESTIGATION OF SURFACE PROCESSES ON ALGAAS/GAAS CLEAVAGE EDGES AS STUDIED BY ATOMIC-FORCE MICROSCOPY FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1995, 353 (5-8): : 670 - 674
- [10] Atomic force microscopy and Raman scattering study of GaAs/InAs(111) A and B MOVPE heterostructures SEMICONDUCTING AND INSULATING MATERIALS, 1996: PROCEEDINGS OF THE 9TH CONFERENCE ON SEMICONDUCTING AND INSULATING MATERIALS (SIMC'96), 1996, : 181 - 184