AUTOMATED PHASE-MEASURING PROFILOMETRY: A PHASE MAPPING APPROACH.

被引：0
|
作者：
Srinivasan, V. [1 ]
Liu, H.C. [1 ]
Halioua, Maurice [1 ]
机构：
[1] New York Inst of Technology, Cent, for Optics, Lasers, &, Holography, Old Westbury, NY, USA, New York Inst of Technology, Cent for Optics, Lasers, & Holography, Old Westbury, NY, USA
来源：
| 1600年 / 24期
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学科分类号：
摘要：
PHASE MODULATION
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