Current density dependence for dark-line defect growth velocity in strained InGaAs/AlGaAs quantum well laser diodes

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[1] Fukagai, Kazuo
[2] Ishikawa, Shin
[3] Endo, Kenji
[4] Yuasa, Tonao
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Fukagai, Kazuo | 1600年 / 30期
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Electron Beams - Semiconducting Films - Strain - Semiconducting Indium Compounds - Semiconductor Diodes - Electric Properties;
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摘要
Dark-line defects (DLDs) of threading dislocation origin in strained InGaAs/AlGaAs quantum well laser diodes were observed by the electron-beam induced current technique. Current density dependence for the DLD growth velocity was compared quantitatively with that for unstrained GaAs/AlGaAs quantum well laser diodes for the first time. The 〈110〉 DLD growth velocity in InGaAs QW laser diodes is estimated to be about 1/100 of that for the 〈110〉 DLD growth in the GaAs QW laser diodes, showing linear dependence on injected current densities.
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