X-ray diffraction study of texture evolution in electrodeposited zinc layers

被引：0
|
作者：
Tomov, I. [1 ]
机构：
[1] Bulgarian Acad of Sciences, Sofia, Bulgaria
来源：
Materials Science Forum | 1994年 / 157-6卷 / pt 2期
关键词：
Growth selection - Oriented growth - Oriented nucleation - Pole density - Texture evolution - Texture sharpness - Thin surface sublayer - Vapor deposited layer - X ray diffraction method - Zinc layers;
D O I：
10.4028/www.scientific.net/msf.157-162.1495
中图分类号：
学科分类号：
摘要：
引用
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页码：1495 / 1500
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