共 50 条
- [34] nm-scaled workfunction mapping of the interfaces of silicon heterojunction (SHJ) solar cell using Kelvin probe force microscopy 2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2014, : 3040 - 3042
- [36] Kelvin probe force microscopy of beveled semiconductors JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (05): : 2133 - 2136
- [37] Kelvin probe force microscopy of molecular surfaces ANNUAL REVIEW OF MATERIALS SCIENCE, 1999, 29 : 353 - 380
- [39] Practical aspects of Kelvin probe force microscopy REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (03): : 1756 - 1760