Investigation of charge transfer in nanostructured hybrid solar cell using Kelvin Probe Force Microscopy

被引:0
|
作者
Lan, Fei [1 ]
Wei, Fanan [1 ]
Jiang, Minlin [1 ]
Li, Guangyong [1 ]
机构
[1] Department of Electrical and Computer Engineering, University of Pittsburgh, Pittsburgh, PA, 15261, United States
关键词
Charge transfer process - Kelvin probe force microscopy - KPFM - Nano-structured - Singlewalled carbon nanotube (SWCNT) - Surface potential distributions - SWCNT - Zinc oxide nanowires;
D O I
6744240
中图分类号
学科分类号
摘要
引用
收藏
页码:681 / 684
相关论文
共 50 条
  • [31] Visualizing Charge Transport and Nanoscale Electrochemistry by Hyperspectral Kelvin Probe Force Microscopy
    Collins, Liam
    Vasudevan, Rama K.
    Sehirlioglu, Alp
    ACS APPLIED MATERIALS & INTERFACES, 2020, 12 (29) : 33361 - 33369
  • [32] Kelvin probe force microscopy for the characterization of semiconductor surfaces in chalcopyrite solar cells
    Sommerhalter, C
    Sadewasser, S
    Glatzel, T
    Matthes, TW
    Jäger-Waldau, A
    Lux-Steiner, MC
    SURFACE SCIENCE, 2001, 482 : 1362 - 1367
  • [33] Photo-generated charge behaviors in all-polymer solar cells studied by Kelvin probe force microscopy
    Cui, Zequn
    Sun, Jianxia
    Niu, Xiaona
    Chen, Jianmei
    Ma, Wanli
    Chi, Lifeng
    ORGANIC ELECTRONICS, 2016, 39 : 38 - 42
  • [34] nm-scaled workfunction mapping of the interfaces of silicon heterojunction (SHJ) solar cell using Kelvin probe force microscopy
    Yamada, Fumihiko
    Kamioka, Takefumi
    Tachibana, Tomihisa
    Nakamura, Kyotaro
    Ohshita, Yoshio
    Kamiya, Itaru
    2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC), 2014, : 3040 - 3042
  • [35] Direct observation of charge accumulation in quantum well solar cells by cross-sectional Kelvin probe force microscopy
    Noda, Takeshi
    Ishida, Nobuyuki
    Mano, Takaaki
    Fujita, Daisuke
    APPLIED PHYSICS LETTERS, 2020, 116 (16)
  • [36] Kelvin probe force microscopy of beveled semiconductors
    Ferguson, RS
    Fobelets, K
    Cohen, LF
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (05): : 2133 - 2136
  • [37] Kelvin probe force microscopy of molecular surfaces
    Fujihira, M
    ANNUAL REVIEW OF MATERIALS SCIENCE, 1999, 29 : 353 - 380
  • [38] Kelvin probe force microscopy and its application
    Melitz, Wilhelm
    Shen, Jian
    Kummel, Andrew C.
    Lee, Sangyeob
    SURFACE SCIENCE REPORTS, 2011, 66 (01) : 1 - 27
  • [39] Practical aspects of Kelvin probe force microscopy
    Jacobs, HO
    Knapp, HF
    Stemmer, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (03): : 1756 - 1760
  • [40] Kelvin probe force microscopy for material characterization
    Glatzel, Thilo
    Gysin, Urs
    Meyer, Ernst
    MICROSCOPY, 2022, 71 : i165 - i173