Novel method for perpendicularity measurement of high precision hexahedron

被引：0
|
作者：
Zheng, Zi-Wen [1 ]
Weng, Lei [1 ]
Chen, Shan-Yong [1 ]
Li, Sheng-Yi [1 ]
机构：
[1] College of Mechtronics Engineering and Automation, National University of Defense Technology, Changsha 410073, China
来源：
Guangxue Jishu/Optical Technique | 2008年 / 34卷 / 03期
关键词：
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页码：391 / 394
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