Technical property and application of industrial computed tomography

被引：0
|
作者：
Sun, Ling-Xia [1 ]
Ye, Yun-Chang [1 ]
机构：
[1] China Academy of Engineering Physics, Mianyang 621900, China
来源：
Hedianzixue Yu Tance Jishu/Nuclear Electronics and Detection Technology | 2006年 / 26卷 / 04期
关键词：
D O I：
10.1016/j.jbiotec.2006.01.033
中图分类号：
学科分类号：
摘要：
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页码：486 / 488
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