Depth dependence of elastic grain interaction and mechanical stress: Analysis by x-ray diffraction measurements at fixed penetration/information depths

被引：0
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作者：
Kumar, A. [1 ]
Welzel, U. [1 ]
Mittemeijer, E.J. [1 ]
机构：
[1] Max Planck Institute for Metals Research, Heisenbergstrasse 3, D-70569 Stuttgart, Germany
来源：
Journal of Applied Physics | 2006年 / 100卷 / 11期
关键词：
Gradients of the type of elastic grain interaction and the (residual) internal state of stress were determined. This was possible by the application of x-ray diffraction stress measurements at various fixed penetration/ information depths. The analysis was applied to nickel films of thicknesses 2 and 4 μm. Surface anisotropy was considered as source of direction-dependent (anisotropic) elastic grain interaction. It was found that only a small gradient of the state of stress; but a pronounced gradient of the grain interaction constraints; prevails in the investigated specimens. Thereby the evidence for the depth dependence of the so-called surface anisotropy was obtained. © 2006 American Institute of Physics;
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