Hard X-ray nano-interferometer and its application to high-spatial- resolution phase tomography

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Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Japan [1 ]
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Jpn J Appl Phys Part 2 Letter | / 42-45卷 / L1159-L1161期
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Fringe scanning methods - Phase contrast - Phase retrieval - Phase tomography - X-ray interferometers - Zone plates;
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