Hydrogen modulation-doped structures to improve crystalline fraction of polycrystalline silicon films prepared by excimer laser annealing at low energy densities

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作者
Heya, Akira [1 ]
Matsuo, Naoto [1 ]
Serikawa, Tadashi [2 ]
Kawamoto, Naoya [3 ]
机构
[1] University of Hyogo, 2167 Shosha, Himeji, Hyogo 671-2280, Japan
[2] Osaka University, 11-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan
[3] Yamaguchi University, Tokiwadai, Ube, Yamaguchi 755-8611, Japan
关键词
An excimer laser annealing (ELA) of amorphous silicon (a-Si) with a hydrogen modulation-doped layer (ELHMD) was investigated using a-Si films with various H concentrations and H distributions for forming high-quality polycrystalline silicon (poly-Si) films at a low energy irradiation (100mJ/cm2). Poly-Si films with a high crystalline fraction of 80% are obtained by controlling the H concentration distribution and shot number for ELA. In addition; the film exfoliation caused by a H2 burst can be suppressed; and secondary grain growth can be induced using HMD a-Si films. It is considered that the nucleation is enhanced by the recombination energy of the H atoms around the SI-H2 bond during Si melting and that H desorption affects grain growth and film exfoliation. © 2007 The Japan Society of Applied Physics;
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页码:7858 / 7860
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