Bad Data Identification and Correction Algorithm of μPMUs

被引：0
|
作者：
Lee, Kyung-Min [1 ]
Kwon, Dae-Yun [2 ]
Park, Chul-Won [1 ]
机构：
[1] Dept. of Electrical Engineering, Gangneung-Wonju National University, Korea, Republic of
[2] R&D Center, AMITEK, Korea, Republic of
来源：
Transactions of the Korean Institute of Electrical Engineers | 2024年 / 73卷 / 11期
关键词：
Smart power grids;
D O I：
10.5370/KIEE.2024.73.11.1939
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1939 / 1944
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