Minimal-length interoperability test sequences generation via genetic algorithm

被引：0
|
作者：
School of Information Science and Technology, Beijing Institute of Technology, Beijing 100081, China [1 ]
机构：
来源：
J Beijing Inst Technol Engl Ed | 2008年 / 3卷 / 341-345期
关键词：
Genetic algorithms;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [1] Minimal-Length Interoperability Test Sequences Generation via Genetic Algorithm
    钟宁
    匡镜明
    何遵文
    Journal of Beijing Institute of Technology, 2008, (03) : 341 - 345
  • [2] On the Generation of Minimal-Length Conformance Tests for Communication Protocols
    Miller, Raymond E.
    Paul, Sanjoy
    IEEE-ACM TRANSACTIONS ON NETWORKING, 1993, 1 (01) : 116 - 129
  • [3] Optimal Protocol Interoperability Test Generation via Heuristic Algorithm
    Zhong, Ning
    He, Zunwen
    Kuang, Jingming
    Zhuo, Zhihai
    ICICSE: 2008 INTERNATIONAL CONFERENCE ON INTERNET COMPUTING IN SCIENCE AND ENGINEERING, PROCEEDINGS, 2008, : 278 - 281
  • [4] IMAGE AND BOUNDARY SEGMENTATION VIA MINIMAL-LENGTH ENCODING ON THE CONNECTION MACHINE
    LECLERC, YG
    IMAGE UNDERSTANDING WORKSHOP /, 1989, : 1056 - 1069
  • [5] Ground state of the hydrogen atom via Dirac equation in a minimal-length scenario
    Antonacci Oakes, T. L.
    Francisco, R. O.
    Fabris, J. C.
    Nogueira, J. A.
    EUROPEAN PHYSICAL JOURNAL C, 2013, 73 (07): : 1 - 6
  • [6] Ground state of the hydrogen atom via Dirac equation in a minimal-length scenario
    T. L. Antonacci Oakes
    R. O. Francisco
    J. C. Fabris
    J. A. Nogueira
    The European Physical Journal C, 2013, 73
  • [7] Automatic generation of basis test paths using variable length genetic algorithm
    Ghiduk, Ahmed S.
    INFORMATION PROCESSING LETTERS, 2014, 114 (06) : 304 - 316
  • [8] Improved robustness test sequences generation algorithm
    Gao Xiang
    Yan Xue-xiong
    Kang Fei
    You Ye-bin
    2010 2ND INTERNATIONAL CONFERENCE ON E-BUSINESS AND INFORMATION SYSTEM SECURITY (EBISS 2010), 2010, : 462 - 465
  • [9] A genetic algorithm framework for test generation
    Rudnick, EM
    Patel, JH
    Greenstein, GS
    Niermann, TM
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1997, 16 (09) : 1034 - 1044
  • [10] On using genetic algorithm for test generation
    Brik, M
    Raik, J
    Ubar, R
    Ivask, E
    BEC 2004: Proceeding of the 9th Biennial Baltic Electronics Conference, 2004, : 233 - 236
12345