An intelligent approach to detect facial retouching using Fine Tuned VGG16

被引：0
|
作者：
Sheth, Kinjal Ravi [1 ]
机构：
[1] Department of Electronics and Communication Engineering, Faculty of Engineering and Technology, Atmiya University, India
来源：
International Journal of Biometrics | 2024年 / 16卷 / 06期
关键词：
Transfer learning;
D O I：
10.1504/IJBM.2024.141937
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：583 / 600
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