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- [21] Nonlinear Dark-Field Imaging of One-Dimensional Defects in Monolayer DichalcogenidesNANO LETTERS, 2020, 20 (01) : 284 - 291Carvalho, Bruno R.论文数: 0 引用数: 0 h-index: 0机构: Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, Brazil Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilWang, Yuanxi论文数: 0 引用数: 0 h-index: 0机构: Penn State Univ, Dept Phys, University Pk, PA 16802 USA Penn State Univ, Ctr 2 Dimens & Layered Mat, University Pk, PA 16802 USA Penn State Univ, 2 Dimens Crystal Consortium, University Pk, PA 16802 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilFujisawa, Kazunori论文数: 0 引用数: 0 h-index: 0机构: Penn State Univ, Dept Phys, University Pk, PA 16802 USA Penn State Univ, Ctr 2 Dimens & Layered Mat, University Pk, PA 16802 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilZhang, Tianyi论文数: 0 引用数: 0 h-index: 0机构: Penn State Univ, Ctr 2 Dimens & Layered Mat, University Pk, PA 16802 USA Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilKahn, Ethan论文数: 0 引用数: 0 h-index: 0机构: Penn State Univ, Ctr 2 Dimens & Layered Mat, University Pk, PA 16802 USA Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilBilgin, Ismail论文数: 0 引用数: 0 h-index: 0机构: Northeastern Univ, Dept Phys, Boston, MA 02115 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilAjayan, Pulickel M.论文数: 0 引用数: 0 h-index: 0机构: Rice Univ, Dept Mat Sci & NanoEngn, Houston, TX 77005 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, Brazilde Paula, Ana M.论文数: 0 引用数: 0 h-index: 0机构: Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilPimenta, Marcos A.论文数: 0 引用数: 0 h-index: 0机构: Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, Brazil论文数: 引用数: h-index:机构:Crespi, Vincent H.论文数: 0 引用数: 0 h-index: 0机构: Penn State Univ, Dept Phys, University Pk, PA 16802 USA Penn State Univ, Ctr 2 Dimens & Layered Mat, University Pk, PA 16802 USA Penn State Univ, 2 Dimens Crystal Consortium, University Pk, PA 16802 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilTerrones, Mauricio论文数: 0 引用数: 0 h-index: 0机构: Penn State Univ, Dept Phys, University Pk, PA 16802 USA Penn State Univ, Ctr 2 Dimens & Layered Mat, University Pk, PA 16802 USA Penn State Univ, Dept Mat Sci & Engn, University Pk, PA 16802 USA Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, BrazilMalard, Leandro M.论文数: 0 引用数: 0 h-index: 0机构: Univ Fed Minas Gerais, Dept Fis, BR-30123970 Belo Horizonte, MG, Brazil Univ Fed Rio Grande do Norte, Dept Fis, BR-59078970 Natal, RN, Brazil
- [22] Luminescent surfaces with tailored angular emission for compact dark-field imaging devicesNATURE PHOTONICS, 2020, 14 (05) : 310 - +Chazot, Cecile A. C.论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Mech Engn, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USANagelberg, Sara论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Mech Engn, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USARowlands, Christopher J.论文数: 0 引用数: 0 h-index: 0机构: Imperial Coll London, Dept Bioengn, London, England MIT, Dept Mech Engn, Cambridge, MA 02139 USAScherer, Maik R. J.论文数: 0 引用数: 0 h-index: 0机构: Papierfabrik Louisenthal GmbH, Schwabisch Gmund, Germany MIT, Dept Mech Engn, Cambridge, MA 02139 USACoropceanu, Igor论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Chem, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USABroderick, Kurt论文数: 0 引用数: 0 h-index: 0机构: MIT, Microsyst Technol Lab, 77 Massachusetts Ave, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USAKim, Yunjo论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Mech Engn, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USABawendi, Moungi G.论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Chem, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USASo, Peter T. C.论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Mech Engn, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USAKolle, Mathias论文数: 0 引用数: 0 h-index: 0机构: MIT, Dept Mech Engn, Cambridge, MA 02139 USA MIT, Dept Mech Engn, Cambridge, MA 02139 USA
- [23] Luminescent surfaces with tailored angular emission for compact dark-field imaging devicesNature Photonics, 2020, 14 : 310 - 315Cécile A. C. Chazot论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentSara Nagelberg论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentChristopher J. Rowlands论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentMaik R. J. Scherer论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentIgor Coropceanu论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentKurt Broderick论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentYunjo Kim论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentMoungi G. Bawendi论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentPeter T. C. So论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering DepartmentMathias Kolle论文数: 0 引用数: 0 h-index: 0机构: Massachusetts Institute of Technology,Mechanical Engineering Department
- [24] Influence of light polarization state on the imaging quality of dark-field imaging systemJOURNAL OF OPTICS, 2022, 24 (03)Chen, Dan论文数: 0 引用数: 0 h-index: 0机构: Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R China Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R ChinaWang, Yuqin论文数: 0 引用数: 0 h-index: 0机构: Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R China Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R ChinaZhang, Rongzhu论文数: 0 引用数: 0 h-index: 0机构: Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R China Sichuan Univ, Coll Elect & Informat Engn, Chengdu 610065, Peoples R China
- [25] Dark-field hyperlens: Super-resolution imaging of weakly scattering objectsOPTICS EXPRESS, 2015, 23 (19): : 25350 - 25364Repan, Taavi论文数: 0 引用数: 0 h-index: 0机构: Univ Tartu, Inst Phys, EE-50411 Tartu, Estonia Tech Univ Denmark, DTU Foton, DK-2800 Lyngby, Denmark Univ Tartu, Inst Phys, EE-50411 Tartu, EstoniaLavrinenko, Andrei V.论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Denmark, DTU Foton, DK-2800 Lyngby, Denmark Univ Tartu, Inst Phys, EE-50411 Tartu, EstoniaZhukovsky, Sergei V.论文数: 0 引用数: 0 h-index: 0机构: Tech Univ Denmark, DTU Foton, DK-2800 Lyngby, Denmark ITMO Univ, St Petersburg 197101, Russia Univ Tartu, Inst Phys, EE-50411 Tartu, Estonia
- [26] Development of a confocal line-scan laser scattering probe for dark-field surface defects detection of transmissive opticsREVIEW OF SCIENTIFIC INSTRUMENTS, 2022, 93 (08):Dong, Jingtao论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaChang, Kai论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaTian, Zhipeng论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaZhang, Tengda论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaLang, Xianli论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaZhang, Yuzhong论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaLu, Rongsheng论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R ChinaXie, Xinglong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Key Lab High Power Laser & Phys, Shanghai 201800, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Anhui, Peoples R China
- [27] Development of a confocal line-scan laser scattering probe for dark-field surface defects detection of transmissive opticsREVIEW OF SCIENTIFIC INSTRUMENTS, 2023, 93 (08):Dong, Jingtao论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaChang, Kai论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaTian, Zhipeng论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaZhang, Tengda论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaLang, Xianli论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaZhang, Yuzhong论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaLu, Rongsheng论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R ChinaXie, Xinglong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Key Lab High Power Laser & Phys, Shanghai 201800, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Inst, Hefei 230009, Anhui, Peoples R China
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- [30] Dark-field line confocal imaging with point confocality and extended line field for bulk defects detectionCHINESE OPTICS LETTERS, 2023, 21 (04)Dong, Jingtao论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R ChinaZhang, Tengda论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R ChinaYang, Lei论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R ChinaZhang, Yuzhong论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R ChinaLu, Rongsheng论文数: 0 引用数: 0 h-index: 0机构: Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R ChinaXie, Xinglong论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Shanghai Inst Opt & Fine Mech, Key Lab High Power Laser & Phys, Shanghai 201800, Peoples R China Hefei Univ Technol, Sch Instrument Sci & Optoelect Engn, Anhui Prov Key Lab Measuring Theory & Precis Instr, Hefei 230009, Peoples R China