Critical thickness for formation of fatigue dislocation structures: A discrete dislocation dynamics study

被引：0

作者：

Shimada, Takahiro ^{[1
]}

Kondo, Tadahiro ^{[1
]}

Kitamura, Takayuki ^{[1
]}

机构：

[1] Kyoto University, Department of Mechanical Engineering and Science Yoshida-Hommachi, Sakyo-ku, Kyoto, 606-8501, Japan

来源：

Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A | 2012年 / 78卷 / 793期

关键词：

Copper thin film - Critical thickness - Discrete dislocation dynamics - Dislocation structures - Dislocation walls - Films thinner - Persistent slip bands;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：1242 / 1249

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