Critical thickness for formation of fatigue dislocation structures: A discrete dislocation dynamics study

被引：0
|
作者：
Shimada, Takahiro [1 ]
Kondo, Tadahiro [1 ]
Kitamura, Takayuki [1 ]
机构：
[1] Kyoto University, Department of Mechanical Engineering and Science Yoshida-Hommachi, Sakyo-ku, Kyoto, 606-8501, Japan
来源：
Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A | 2012年 / 78卷 / 793期
关键词：
Copper thin film - Critical thickness - Discrete dislocation dynamics - Dislocation structures - Dislocation walls - Films thinner - Persistent slip bands;
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学科分类号：
摘要：
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页码：1242 / 1249
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