Analysis of back-flashover lightning- withstanding level of 500-kv-double-circuit transmission lines

被引：0

作者：

Wu, Shihong ^{[1
]}

Wen, Xishan ^{[1
]}

Li, Rui ^{[1
]}

Xu, Yang ^{[1
]}

机构：

[1] College of Electrical Engineering, Wuhan University, Wuhan,430072, China

来源：

Lecture Notes in Electrical Engineering | 2015年 / 334卷

关键词：

Timing circuits;

D O I：

10.1007/978-3-319-13707-0_43

中图分类号：

学科分类号：

摘要：

This chapter analyzes the lightning performance of 500-kV-double-circuit transmission lines by the Alternative Transient Performance-Electromagnetic Transient Program (ATP-EMTP). With towers using the multi-wave impedance model and eliminating voltage reflection on the lines by a matching resistor, a simulation method has been established to evaluate the factors that may influence the backflashover voltage such as tower height, tower footing resistance, and conductor phase arrangements. A statistical method is presented to calculate the line trip-out rates due to back-flashover. The results show that the impact of phase arrangements on the back-flashover trip-out rate of a single-circuit line is little, but significant on the double-circuit lines. © Springer International Publishing Switzerland 2015.

引用

页码：389 / 397

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