Influence of Al content on microstructure and oxidation resistance of (V, W, Al)N composite films

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作者
Yu, Li-Hua [1 ]
Wang, Jie [1 ]
Xu, Jun-Hua [1 ]
机构
[1] School of Materials Science and Engineering, Jiangsu University of Science and Technology, Key Laboratory of Advanced Welding Technology, Zhenjiang , China
关键词
Aluminum nitride - X ray diffraction - Microstructure - Nitrogen compounds - Composite films - Aluminum - Magnetron sputtering - Crystal structure - III-V semiconductors;
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页码:172 / 177
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