Measurement of residual stress induced by laser irradiation on grain oriented silicon steel using X-ray diffraction

被引：2
|
作者：
Musashi Inst of Tech., Setagaya-ku, Tokyo, 158-8557 [1 ]
不详 [2 ]
不详 [3 ]
不详 [4 ]
不详 [5 ]
机构：
来源：
Zairyo | 2007年 / 7卷 / 609-614期
关键词：
Residual stresses;
D O I：
10.2472/jsms.56.609
中图分类号：
学科分类号：
摘要：
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