Measurement of the cut depth of grain in nano-grinding of silicon wafers

被引:0
|
作者
Key Laboratory for Precision and Nontraditional Machining, Dalian University of Technology, Dalian 116024, China [1 ]
机构
来源
Jingangshi yu Moliao Moju Gongcheng | 2006年 / 5卷 / 69-73期
关键词
9;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] Experimental study on new bonding materials for developing nano-grinding plates
    Peng, W.
    Yao, C.Y.
    Lv, X.
    Liu, F.Q.
    Gao, T.
    Yuan, J.L.
    Key Engineering Materials, 2007, 329 : 489 - 494
  • [32] Control of grain depth of cut in ductile mode grinding of brittle materials and practical application
    Kanai, A
    Miyashita, M
    Inaba, F
    Sato, M
    Yokotsuka, T
    Kato, R
    ADVANCES IN ABRASIVE TECHNOLOGY, 1997, : 101 - 105
  • [33] Fabrication of nanoabrasive grinding wheels and their application to grinding silicon wafers
    Kim, T. W.
    Hyun, S. H.
    Kim, J.
    Lee, J. H.
    Lee, H. W.
    SCIENCE OF ENGINEERING CERAMICS III, 2006, 317-318 : 373 - 376
  • [34] Fine grinding of silicon wafers: a mathematical model for grinding marks
    Chidambaram, S
    Pei, ZJ
    Kassir, S
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2003, 43 (15): : 1595 - 1602
  • [35] Experimental determination of optimum parameters for nano-grinding of optical fibre end faces
    Gharbia, YA
    Katupitiya, J
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2004, 44 (7-8): : 725 - 731
  • [36] Simulation of nano-grinding of GaN textured surface under ionic liquids lubrication
    Zhang, Shuai
    Dai, Houfu
    MATERIALS TODAY COMMUNICATIONS, 2024, 39
  • [37] Investigation of vibration-assisted nano-grinding of gallium nitride via molecular dynamics
    Huang, Yuhua
    Wang, Miaocao
    Xu, Yixin
    Zhu, Fulong
    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2021, 121
  • [38] ELID grinding of silicon wafers: A literature review
    Liu, J. H.
    Pei, Z. J.
    Fisher, Graham R.
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2007, 47 (3-4): : 529 - 536
  • [39] Fine grinding of silicon wafers: designed experiments
    Pei, ZJ
    Strasbaugh, A
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 2002, 42 (03): : 395 - 404
  • [40] Grinding induced subsurface cracks in silicon wafers
    Pei, ZJ
    Billingsley, SR
    Miura, S
    INTERNATIONAL JOURNAL OF MACHINE TOOLS & MANUFACTURE, 1999, 39 (07): : 1103 - 1116