Investigation of shape, strain, and interdiffusion in InGaAs quantum rings using grazing incidence x-ray diffraction

被引：0

作者：

Sztucki, Michael ^{[1
]}

Metzger, Till Hartmut ^{[1
]}

Chamard, Virginie ^{[2
]}

Hesse, Anke ^{[3
]}

Holý, Václav ^{[4
]}

机构：

[1] European Synchrotron Radiation Facility, BP 220, 38043 Grenoble Cedex, France

[2] Laboratoire de Thermodynamique et Physico-chimie Métallurgiques, UMR 5614, INPG, BP 75, 38402 St. Martin d'Heres Cedex, France

[3] Institute of Semiconductor Physics, University of Linz, Altenbergerstrasse 69, A-4040 Linz, Austria

[4] Department of Physics of Electronic Structures, Charles University, Ke Karlovu 5, 121 16 Prague, Czech Republic

来源：

Journal of Applied Physics | 1600年 / 99卷 / 03期

关键词：

21;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用

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