Ultrafast pump-probe detection of X-ray induced transient optical reflectivity changes in GaAs

被引：0
|
作者：
Wang, Bo [1 ,2 ,3 ]
Bai, Yonglin [1 ,2 ]
Xu, Peng [2 ]
Gou, Yongsheng [2 ,3 ]
Zhu, Bingli [2 ]
Bai, Xiaohong [1 ]
Liu, Baiyu [2 ]
Qin, Junjun [1 ]
机构：
[1] State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an,710119, China
[2] Key Laboratory of Ultra-fast Photoelectric Diagnostics Technology, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an,710119, China
[3] University of Chinese Academy of Sciences, Beijing,100049, China
来源：
Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering | 2015年 / 44卷 / 10期
关键词：
Compendex;
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中图分类号：
学科分类号：
摘要：
X ray detectors
引用
收藏
页码：3130 / 3133
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