Anomaly detection based on extended mathematical morphology for hyperspectral imagery

被引：0
|
作者：
Li, Na [1 ]
Zhao, Huijie [1 ]
Jia, Guorui [1 ]
Dong, Chao [1 ]
机构：
[1] Key Laboratory of Precision Opto-Mechatronics Technology, School of Instrument Science and Opto-Electronics Engineering, Beijing University of Aeronautics and Astronautics, Beijing 100083, China
来源：
Guangxue Xuebao/Acta Optica Sinica | 2008年 / 28卷 / 08期
关键词：
Mathematical morphology;
D O I：
10.3788/AOS20082808.1480
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1480 / 1484
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