Microwave losses in a quasioptical dielectric resonator as a function of the thickness of ultra-thin conducting endplates

被引：0

作者：

Barannik, A.A. ^{[1
]}

Stetsenko, A.N. ^{[2
]}

Cherpak, N.T. ^{[1
]}

机构：

[1] A. Usikov Institute of Radio Physics and Electronics, National Academy of Sciences of Ukraine, 12, Academician Proskura St., Kharkov 61085, Ukraine

[2] National Technical University, 21, Frunze Str., Kharkiv 61001, Ukraine

来源：

Telecommunications and Radio Engineering (English translation of Elektrosvyaz and Radiotekhnika) | 2006年 / 65卷 / 19期

关键词：

Dielectric resonators - Film thickness - Thickness measurement - Ultrathin films;

D O I：

10.1615/TelecomRadEng.v65.i19.40

中图分类号：

学科分类号：

摘要：

We report on a large sharp variation (∼103 times) of the quality-factor of a quasioptical dielectric resonator with conducting endplates in the form of ultra-thin copper films as their thickness changes only to ∼0.9 nm. The measurements have been carried out in the 8-mm waveband at room temperature. An explanation of the effect is represented based on both the microwave properties of the resonator with a film and the dependence of continuity of ultra-thin copper films on the thickness. © 2006 Begell House, Inc.

引用

页码：1783 / 1788

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