The software design for infrared photoelectric target measuring system

被引：0
|
作者：
Li, Chun-Yan [1 ]
Liu, Qun-Hua [1 ]
Ma, Wei-Hong [1 ]
Tan, Li-Xun [1 ]
机构：
[1] Optoelectronical Test Institute, Xi'an Institute of Technology, Xi'an 710032, China
来源：
Guangxue Jishu/Optical Technique | 2006年 / 32卷 / 02期
关键词：
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页码：174 / 176
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