The study of structure-dependent properties of thin magnetic films at microwaves by field-domain resonance technique

被引：8
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作者：
Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences, Russia [1 ]
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来源：
Prog. Electromagn. Res. C | 2009年 / 43-55期
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D O I：
10.2528/PIERC09042804
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