Simulation of hub flaw X-ray images

被引:0
|
作者
Huang, Qian [1 ]
Ou, Yanhua [1 ]
机构
[1] School of Electronic and Information Engineering, South China University of Technology, Guangzhou 510641, China
关键词
10;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:475 / 478
相关论文
共 50 条
  • [31] Pulsed X-ray flaw detector with a digital imaging system
    Shcherbinin, SV
    Motovilov, VA
    Filatov, AL
    RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING, 1999, 35 (12) : 946 - 950
  • [32] Choice of optimal radiation energy in X-ray flaw detection
    D. S. Anikonov
    I. V. Prokhorov
    Doklady Mathematics, 2006, 73 : 449 - 452
  • [33] Estimates of flaw detectability in welded joints by X-ray testing
    Zuev, VM
    RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING, 2001, 37 (03) : 214 - 221
  • [34] ELECTROLUMINESCENT STORAGE SCREENS IN X-RAY FLAW DETECTION.
    Amfiteatrov, V.V.
    Kudryavtseva, M.V.
    Lipin, A.L.
    Soviet Journal of Nondestructive Testing (English translation of Defektoskopiya), 1975, 11 (03): : 394 - 395
  • [35] Choice of optimal radiation energy in X-ray flaw detection
    Anikonov, D. S.
    Prokhorov, I. V.
    DOKLADY MATHEMATICS, 2006, 73 (03) : 449 - 452
  • [36] Translating Simulation Images to X-Ray Images via Multi-scale Semantic Matching
    Kang, Jingxuan
    Jianu, Tudor
    Huang, Baoru
    Bhattarai, Binod
    Ngan Le
    Coenen, Frans
    Anh Nguyen
    DATA ENGINEERING IN MEDICAL IMAGING, DEMI 2024, 2025, 15265 : 95 - 104
  • [37] Independent component analysis for removing x-ray scatter in x-ray images
    Chen, Yen-Wei
    Han, Xianhua
    Oikawa, Shiro
    Fujita, Akinori
    2007 IEEE INSTRUMENTATION & MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5, 2007, : 2327 - +
  • [38] SIMULATION OF X-RAY TOPOGRAPHS
    EPELBOIN, Y
    MATERIALS SCIENCE AND ENGINEERING, 1985, 73 (1-2): : 1 - 43
  • [39] IMAGES OF SINGLE X-RAY PHOTONS FROM X-RAY PHOSPHOR SCREENS
    FISHMAN, GJ
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1981, 52 (08): : 1143 - 1147
  • [40] VIDEO DISPLAY OF X-RAY IMAGES .1. X-RAY TOPOGRAPHS
    MEIERAN, ES
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (04) : 619 - &