Growth and optical characterization of Ga2O3 nanorods

被引：0
|
作者：
Zhang, Shi-Ying [1 ]
Zhuang, Hui-Zhao [1 ]
Xue, Cheng-Shan [1 ]
Li, Bao-Li [1 ]
机构：
[1] Institute of Semiconductors, College of Physics and Electronics, Shandong Normal University, Ji'nan 250014, China
来源：
Gongneng Cailiao/Journal of Functional Materials | 2008年 / 39卷 / 04期
关键词：
Annealing - Electron diffraction - Energy dispersive spectroscopy - Growth (materials) - Magnetron sputtering - Nanorods - Optical properties - Photoluminescence - Scanning electron microscopy - Transmission electron microscopy - X ray diffraction analysis;
D O I：
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中图分类号：
学科分类号：
摘要：
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页码：681 / 683
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