A method for diagnosing resistive open faults with considering adjacent lines

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作者：
Graduate School of Science and Engineering, Ehime University, Japan [1 ]
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来源：
ISCIT - Int. Symp. Commun. Inf. Technol. | / 609-614期
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Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
5665061
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摘要：
Failure analysis - Delay circuits
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