Testing system for radiation effects of CCD and CMOS image sensors

被引：6
|
作者：
Li, Yu-Dong [1 ,2 ]
Wang, Bo [1 ,2 ,3 ]
Guo, Qi [1 ,2 ]
Ma, Li-Ya [1 ,2 ,3 ]
Ren, Jian-Wei [4 ]
机构：
[1] Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China
[2] Key Laboratory of Functional Materials and Devices under Special Environments, Chinese Academy of Sciences, Urumqi 830011, China
[3] University of Chinese Academy of Sciences, Beijing 100049, China
[4] Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
来源：
Guangxue Jingmi Gongcheng/Optics and Precision Engineering | 2013年 / 21卷 / 11期
关键词：
D O I：
10.3788/OPE.20132111.2778
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：2778 / 2784
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