Thermal characterization of film-on-substrate systems by laser photothermal reflectance technique

被引：0
|
作者：
College of Mathematics and Physics, Zhejiang Normal University, Jinhua 321004, China [1 ]
机构：
来源：
Zhongguo Jiguang | 2006年 / 3卷 / 385-390期
关键词：
13;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [41] Structural characterization of pulsed laser-deposited hydroxyapatite film on titanium substrate
    Wang, CK
    Lin, JHC
    Ju, CP
    Ong, HC
    Chang, RPH
    BIOMATERIALS, 1997, 18 (20) : 1331 - 1338
  • [42] Characterisation of high thermal conductivity thin-film substrate systems and their interface thermal resistance
    Moridi, Alireza
    Zhang, Liangchi
    Liu, Weidong
    Duvall, Steven
    Brawley, Andrew
    Jiang, Zhuangde
    Yang, Shuming
    Li, Changsheng
    SURFACE & COATINGS TECHNOLOGY, 2018, 334 : 233 - 242
  • [43] Characterization of the Laser Bonding of a Linear Low Density Polyethylene Film to a Polypropylene Substrate
    Dowding, C. F.
    Griffiths, J. D.
    Lawrence, J.
    LASERS IN ENGINEERING, 2014, 28 (5-6) : 303 - 317
  • [44] Reexamining the 3-omega technique for thin film thermal characterization
    Tong, Tao
    Majumdar, Arun
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2006, 77 (10):
  • [45] An optimized thermo-reflectance technique for thermal conductivity measurements of thin-film electronic materials
    Burzo, M. G.
    Komarov, P. L.
    Raad, P. E.
    THERMAL CONDUCTIVITY 28: THERMAL EXPANSION 16, 2006, 28 : 413 - +
  • [46] Measurement of Thermal Conductivity and Interfacial Thermal Resistance of Bismuth Film Deposited on Sapphire Substrate by Frequency Domain Thermo-Reflectance Method
    Kato, R.
    Xu, Y.
    THERMAL CONDUCTIVITY 30:THERMAL EXPANSION 18, 2010, 30 : 926 - 926
  • [47] Optical characterization of InAs film grown on SnO2 substrate by the electrodeposition technique
    Lajnef, M.
    Ezzaouia, H.
    Chtourou, R.
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2008, 41 (12)
  • [48] Femtosecond Laser Generated Hierarchical Macropore/LIPSS Metasurfaces and Their Ultrabroadband Absorbance, Photothermal Properties, and Thermal-Induced Reflectance Oscillation
    Liu, Ruijie
    Zhang, Dongshi
    Ji, Sihan
    Cai, Yunyu
    Liang, Changhao
    Li, Zhuguo
    ACS APPLIED ELECTRONIC MATERIALS, 2022, 4 (03) : 990 - 1001
  • [49] MICRO-TEMPERATURE MEASUREMENTS ON SEMICONDUCTOR-LASER MIRRORS BY REFLECTANCE MODULATION - A NEWLY DEVELOPED TECHNIQUE FOR LASER CHARACTERIZATION
    EPPERLEIN, PW
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1993, 32 (12A): : 5514 - 5522
  • [50] THE USE OF THERMAL FILM CONVERTERS WITH AN ANISOTROPIC STRUCTURE AS ELEMENTS OF LASER SYSTEMS
    GOLUBKOV, GG
    GRACHEV, NM
    KOLEROV, AN
    KOSAKOVSKAYA, ZY
    KOSOLAPOV, OA
    KVANTOVAYA ELEKTRONIKA, 1991, 18 (04): : 490 - 492
12345