Study on test data generation approach

被引：0
|
作者：
Lu, Wang [1 ]
Ma, Guo-Fu [1 ]
Cao, Li-Pei [2 ]
机构：
[1] Department of Computer Engineering, Anyang Institute of Technology, Henan, 455000, Anyang, China
[2] Department of Traffic Information Engineering, Henan Vocational and Technical College of Communications, Henan, 450000, Zhengzhou, China
来源：
Information Technology Journal | 2013年 / 12卷 / 23期
关键词：
D O I：
10.3923/itj.2013.7669.7672
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：7669 / 7672
相关论文
共 50 条
  • [41] Natural Computing for Automatic Test Data Generation Approach Using Spanning Tree Concepts
    Singla, Sanjay
    Kumar, Raj
    Kumar, Dharminder
    INTERNATIONAL CONFERENCE ON COMPUTATIONAL MODELLING AND SECURITY (CMS 2016), 2016, 85 : 929 - 939
  • [42] THE EXTENDED SPECIES PER PATH APPROACH TO GEMGA-BASED TEST DATA GENERATION
    Xin, Zheng-hua
    Li, Hong
    Chen, Guo-long
    Hu, Liang-yi
    Song, Qi-xiang
    Lu, Hong-mei
    JOURNAL OF INVESTIGATIVE MEDICINE, 2014, 62 (08) : S104 - S104
  • [43] PS2Way: An Efficient Pairwise Search Approach for Test Data Generation
    Khatun, Sabira
    Rabbi, Khandakar Fazley
    Yaakub, Che Yahaya
    Klaib, M. F. J.
    Ahmed, Mohammad Masroor
    SOFTWARE ENGINEERING AND COMPUTER SYSTEMS, PT 3, 2011, 181 : 99 - +
  • [44] A Study on an Approach for Analysing Test Basis Using I/O Test Data Patterns
    Yumoto, Tsuyoshi
    Matsuodani, Tohru
    Tsuda, Kazuhiko
    2015 IEEE EIGHTH INTERNATIONAL CONFERENCE ON SOFTWARE TESTING, VERIFICATION AND VALIDATION WORKSHOPS (ICSTW), 2015,
  • [45] Approach to concurrent TTCN test generation
    Bi J.
    Wu J.
    Journal of Computer Science and Technology, 1999, 14 (6) : 614 - 618
  • [46] An Approach to Concurrent TTCN Test Generation
    毕军
    吴建平
    Journal of Computer Science & Technology, 1999, (06) : 614 - 618
  • [47] AUTOMATED SOFTWARE TEST DATA GENERATION
    KOREL, B
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1990, 16 (08) : 870 - 879
  • [48] THE AUTOMATIC-GENERATION OF TEST DATA
    INCE, DC
    COMPUTER JOURNAL, 1987, 30 (01): : 63 - 69
  • [49] A FRAMEWORK FOR INTELLIGENT TEST DATA GENERATION
    CHANG, KH
    CROSS, JH
    CARLISLE, WH
    BROWN, DB
    JOURNAL OF INTELLIGENT & ROBOTIC SYSTEMS, 1992, 5 (02) : 147 - 165
  • [50] Test Data Generation for Database Applications
    Agrawal, Pooja
    Chandra, Bikash
    Emani, K. Venkatesh
    Garg, Neha
    Sudarshan, S.
    2018 IEEE 34TH INTERNATIONAL CONFERENCE ON DATA ENGINEERING (ICDE), 2018, : 1621 - 1624
12345