Effects of energy distribution of interface traps on recombination dc current-voltage line shape

被引：0
|
作者：
Chen, Zuhui [1 ,2 ]
Jie, Bin B. [1 ,3 ]
Sah, Chih-Tang [1 ]
机构：
[1] Florida Solid-State Electronics Laboratory, University of Florida, Gainesville, FL 32611-6200
[2] Xiamen University, Xiamen, China
[3] Peking University, Beijing, China
来源：
Journal of Applied Physics | 2006年 / 100卷 / 11期
关键词：
Electron traps;
D O I：
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摘要：
Journal article (JA)
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